Electronic component tester (EC-Test) / Jonah Micah Miro.
Material type:
TextPublisher: Cebu City, Philippines : University of Cebu-Banilad, c2024Description: 108 pages : color illustrationsContent type: text Media type: unmediated Carrier type: volumeSummary: Ensuring the functionality of electronic components before integrating them into circuits is crucial, traditionally requiring bulky, heavy, and expensive multimeters and oscilloscopes. The Electronic Component Tester (EC-Test) addresses these limitations by offering a compact, affordable, and multifunction solution. This innovative device evaluates and identifies electronic components and assists in debugging circuit designs and measuring voltage waveforms, providing capabilities similar to traditional oscilloscopes.
| Item type | Current location | Call number | Status | Date due | Barcode |
|---|---|---|---|---|---|
| Periodicals | College Annex Library Periodicals | T M67el 2024 (Browse shelf) | Available | 3UCBL000028825 |
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Ensuring the functionality of electronic components before integrating them into circuits is crucial, traditionally requiring bulky, heavy, and expensive multimeters and oscilloscopes. The Electronic Component Tester (EC-Test) addresses these limitations by offering a compact, affordable, and multifunction solution. This innovative device evaluates and identifies electronic components and assists in debugging circuit designs and measuring voltage waveforms, providing capabilities similar to traditional oscilloscopes.
Brigoli, Darlyne College of Computer Engineering Computer Engineering
English
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